RF Industry Icons: Alfonso Farina, Inventor of Track While Scan Radar, IEEE/IET Fellow

Alfonso Farina, a well-known Italian engineer that pioneered new technology in radar systems and signal processing, authored more than 1000 papers, noted for his work to bridge the gap between industry and academy, and fellow with the IEEE and IET, talks with Pat Hindle, Media Director at Microwave Journal, about his passion for engineering, close connection to academia, invention of Track While Scan Radar, advice for young engineers and more. Here is a link to the text version of the conversation.