Eric Camden (lead investigator with Foresite) and Mike Konrad discuss electrochemical migration (ECM) and other failure modes caused by residues on circuit assemblies.
Comments (3)
More Episodes
All Episodes>>
Get this podcast on your phone, Free
Create Your Podcast In Minutes
- Full-featured podcast site
- Unlimited storage and bandwidth
- Comprehensive podcast stats
- Distribute to Apple Podcasts, Spotify, and more
- Make money with your podcast
It is Free
