Ep. 07: EPC's Alex Lidow and GaN Reliability: How to Test to Failure for 100x Performance
Spirit: Behind the Screen

Ep. 07: EPC’s Alex Lidow and GaN Reliability: How to Test to Failure for 100x Performance

2021-02-08
Alex Lidow discusses EPC's test-to-failure method in improving gallium nitride (GaN) devices.   According to Alex, testing to failure has allowed EPC to tease out the exact stressors that cause failure and improve EPC's GaN devices 10-100 times the reliability of commercial devices, and even 100 times reliability in space applications.   Alex and Marti discuss (1:30) Why test to fail (4:14) Learning from failure data and stressors (11:38) Safe Operating Area (14:30) Mechanical s...
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