Technology
Frequency Matters, Oct 3, 2019: EuMW 2019 review plus interview with NI/AWR & UMS
2019-10-11
Microwave Journal editors Pat Hindle and Gary Lerude review EuMW products at the event and talk with David Vye of NI/AWR & Eric LeClerc of UMS about their collaboration on GaN device modeling/simulation. Sponsored by NI/AWR.
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